Measurement Methods and Characterization

The Fraunhofer IOF develops optical measurement methods and systems to customer requirements.

Key areas include the characterization of optical and non-optical surfaces, coatings, components and systems in the micro and sub-nano range as well as 3D shape acquisition.

In 2010, initial results were obtained concerning the spatial identification of substances using THz tomography.

 

3D-measurement

The Fraunhofer IOF designs and realizes optical 3D measuring systems for various applications on the basis of...
 

Optics characterization

Metrology is of vital importance for system development and analysis. The Fraunhofer IOF consequently characterizes new components and checks...
 

Surface and thin film characterization

The Fraunhofer IOF has many years of experience in the field of surface and thin film characterization. This includes investigations of nano- and microstructures...
 

Terahertz-measurement methods

Time of flight measurements of ultrashort THz pulses in combination with broadband spectroscopy enable numerous applications in the field...
 

Metrological computer tomography

Computer tomography enables the non-destructive detection and recording of the internal and external geometry of an object. Using virtual sections...