- High-resolution methods for the analysis of roughness and morphology (atomic force microscopy, scanning electron microscopy, white light interferometry, laser scanning microscopy)
- Analysis of optical properties (spectrophotometry, highly sensitive angle-resolved and total scattered light measurement)
- Analysis of functional properties (wetting analysis, adhesive strength, scratch resistance / tribology, environmental resistance)
We develop and apply methods which are highly sensitive and allow maximum gain of knowledge. They should, however, also be economical and practicable. Additionally, we especially strive for standardization and resilient integration into certified process chains. We are an active member in VDI committees and in DIN/ISO TC 172/SC 9 “Laser and electro-optical systems”.
In addition, we develop customized scattered light-based measuring systems and sensors, which allow a highly efficient, contactless and fast determination of roughness and defects. The systems can be used in a wide range of applications - from machine components to optical surfaces and can be directly integrated into existing manufacturing processes.