From April 3 to 7 and after two years of virtual conferences, more than 200 representatives from the fields of optics, imaging systems, lasers, and advanced cameras met in Orlando for the largest technical exhibition in the field of imaging and sensing, “SPIE’s Defense + Commercial Sensing”. One part of the international event was the conference "Dimensional Optical Metrology and Inspection for Practical Applications XI", in which two teams from Fraunhofer IOF and TU Ilmenau participated. This symposium is focused on methods, analyses, and applications of optical metrology. In addition, the latest advances and developments in various industries were presented.
Particularly qualitative and innovative approaches are honored at the conference with the "Orbbec Best Paper Award" and the "Orbbec Best Student Paper Award". In this year the awards made their way home to Germany, more precisely to Jena and Ilmenau: Patrick Dietrich, Florian Siegmund, Christian Bräuer-Burchardt, Stefan Heist (Fraunhofer IOF), Gunther Notni (TU Ilmenau, Fraunhofer IOF) as well as Christina Junger (TU Ilmenau) were able to convince the eight-member program committee with their forward-looking research contributions.