Nanostructure and microstructure analysis of surfaces and thin films

Investigation of functional properties of surfaces and coatings in the nano- and microranges by scanning probe techniques.

This contains in particular:

  • Atomic Force Microscopy (AFM), White Light Interferometry (WLI), Laser-Scanning Microscopy (LSM), Nomarski microscopy, Focus Variation Method
  • Nanoindentation and nanoscratch testing
  • Evaluation of surfaces and coatings
  • Quantitative analysis
  • Roughness, structure parameters
  • Power-Spectral-Density Function (PSD)
  • Defect sizes etc.
  • Characterization
  • Linking structural properties and functionality:
  • Wetting (e.g. super hydrophobicity)
  • Optics (e.g. light scattering)
  • Abrasion, degradation
  • Combination of characterization and design
  • Development of data processing tools