Optics characterization
Metrology is of vital importance for system development and analysis. The Fraunhofer IOF consequently characterizes new components and checks fully realized systems.
In addition, measurable variables, e.g. regarding scattering properties, luminance distribution or the modulation transfer function (MTF) flow directly into the design process. The Fraunhofer IOF provides the following measuring set-ups for these purposes:
- MTF, focal distance, image scale
- Luminance, near and far field
- Spectrometers
- Laser beam analysis
- Scattered light analysis of optical and non-optical surfaces
- Micro display characterization
- Free-form characterization and measurement of reflective objects
- Measurement of free forms with computer-generated holograms (CGH)
- Deflectrometry