Optics Characterization

Optics characterization

Metrology is of vital importance for system development and analysis. The Fraunhofer IOF consequently characterizes new components and checks fully realized systems.

In addition, measurable variables, e.g. regarding scattering properties, luminance distribution or the modulation transfer function (MTF) flow directly into the design process. The Fraunhofer IOF provides the following measuring set-ups for these purposes:

• MTF, focal distance, image scale
• Luminance, near and far field
• Spectrometers
• Laser beam analysis
• Scattered light analysis of optical and non-optical surfaces
• Micro display characterization
• Free-form characterization and measurement of reflective objects
• Measurement of free forms with computer-generated holograms (CGH)
• Deflectrometry

Waveguide characterization

The Fraunhofer IOF characterizes waveguides using the following measurement methods:

• m-line spectroscopy
• Attenuation test
• RNF measuring set-up to determine the diffraction index distribution in the waveguide cross-section

Characterization of organic LEDs (OLEDs)

Knowledge of the radiation field of OLEDs as new, flat light sources is important for illumination design or measuring systems based on OLEDs and supplies valuable information for system optimization.

The Fraunhofer IOF therefore provides the following measurement methods:

• Measuring the polarization, angle- and wavelength-resolved radiation field in air or in substrate glass
• Integral measurements with Ulbricht sphere
• Angle-resolved measurements with V (lambda) detector

The comparison with rigorous optical simulations enables inference of the molecular emitter properties from the radiation field:

• Internal electro-luminescent spectrum
• Profile of emission zone
• Dipole orientation
• Quantum efficiency of luminescence